Now showing items 1-6 of 6

  • Efficient implementation of multiple on-chip signature checking 

    Abdulla, M F; Ravikumar, C P; A Kumar (1997)
    Detection latency in a BIST scheme is the delay between the time instant at which a faulty response appears and the time instant at which the fault is detected. Conventional BILBO-BIST schemes suffer from long detection ...
  • Hybrid testing schemes based on mutual and signature testing 

    Abdulla, M F; Ravikumar, C P; A Kumar (1998)
    Signature based techniques have been well known for the built-in self-test of integrated systems. We propose a novel test architecture which uses a judicious combination of mutual testing and signature testing to achieve ...
  • A novel BIST architecture with built-in self check 

    Abdulla, M F; Ravikumar, C P; A Kumar (1996)
    We propose an improved BIST architecture which supports on-chip comparison of signatures at no significant increase in area. The BILBO-based BIST architecture, used popularly in application-specific integrated circuits, ...
  • On-chip signature checking for embedded memories 

    Abdulla, M F; Ravikumar, C P; A Kumar (1998)
    The multiple on-chip signature checking architecture proposed by the authors previously is an effective BIST architecture for testing the functional units in modern VLSI circuits. It is characterized by low aliasing, low ...
  • A scheme for multiple on-chip signature checking for embedded SRAMs 

    Abdulla, M F; Ravikumar, C P; A Kumar (1997)
    Pseudorandom self testing of embedded memories is commonly used because of its simplicity. A novel scheme pseudorandom testing with multiple on-chip signature checking (MOSC) has been proposed. Although this scheme results ...
  • A scheme for multiple on-chip signature checking for embedded SRAMS 

    Abdulla, M F; Ravikumar, C P; Kumar, Anshul (2000)
    Embedded read/write memories are integral parts of many VLSI chips designed for specific applications in the areas of computer communications, multimedia, and digital signal processing. Testing an embedded memory poses a ...