Now showing items 1-2 of 2

  • Faut location in general combinatorial circuits 

    Lakshminarasimhan, R (1992)
  • A new test compression scheme 

    Bhaumik, B; Visweswaran, G S; Lakshminarasimhan, R (1999)
    Generalized Modified Positional Syndrome (GMPS), of order p, a new compaction scheme for test output data is presented. The order p determines the aliasing probability and the amount of hardware overhead required to implement ...