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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1430

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dc.contributor.authorChopra, Sonalee-
dc.contributor.authorSharma, Seema-
dc.contributor.authorGoel, T C-
dc.contributor.authorMendiratta, R G-
dc.identifier.citationApplied Surface Science, 230(1-4), 207-214en
dc.description.abstractThin ferroelectric films of calcium modified lead titanate Pb1−xCaxTiO3(PCT) have been prepared by chemical deposition process. The as deposited amorphous films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various amounts of calcium (Ca)-doping (0.20, 0.24, and 0.28) on indium tin oxide (ITO) coated corning glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out at various annealing temperatures (450, 550, and 650 °C). Characterization of these films by XRD shows that the films exhibit tetragonal phase with perovskite structure. Atomic force microscope images (AFM) are characterized by slight surface roughness with a uniform crack-free, densely-packed structure. Also, Fourier transform infrared spectra (FT-IR) of the as deposited film and annealed thin films (x=0.24) at 650 °C on silicon (Si) substrates were taken to get more information about the film formation. Dielectric studies of the films were carried out and reported.en
dc.format.extent386386 bytes-
dc.subjectPCT filmsen
dc.titleEffect of annealing temperature on microstructure of chemically deposited calcium modified lead titanate thin filmsen
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