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http://hdl.handle.net/2074/1430
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| Title: | Effect of annealing temperature on microstructure of chemically deposited calcium modified lead titanate thin films |
| Authors: | Chopra, Sonalee
Sharma, Seema
Goel, T C
Mendiratta, R G |
| Keywords: | PCT films
Sol–gel
Microstructure
AFM
FT-IR |
| Issue Date: | 2004 |
| Citation: | Applied Surface Science, 230(1-4), 207-214 |
| Abstract: | Thin ferroelectric films of calcium modified lead titanate Pb1−xCaxTiO3(PCT) have been prepared by chemical deposition process. The as deposited amorphous films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various amounts of calcium (Ca)-doping (0.20, 0.24, and 0.28) on indium tin oxide (ITO) coated corning glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out at various annealing temperatures (450, 550, and 650 °C). Characterization of these films by XRD shows that the films exhibit tetragonal phase with perovskite structure. Atomic force microscope images (AFM) are characterized by slight surface roughness with a uniform crack-free, densely-packed structure. Also, Fourier transform infrared spectra (FT-IR) of the as deposited film and annealed thin films (x=0.24) at 650 °C on silicon (Si) substrates were... |
| URI: | http://eprint.iitd.ac.in/dspace/handle/2074/1430 |
| Appears in Collections: | Physics
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| chopraeff2004.pdf | | 377Kb | Adobe PDF | View/Open |
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