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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1517

Title: Phase stabilization and microstructural studies of lead lanthanum titanate thin films
Authors: Chopra, Sonalee
Sharma, Seema
Goel, T C
Mendiratta, R G
Keywords: Thin films
Atomic force microscopy
X-ray diffraction
Issue Date: 2005
Citation: Materials Research Bulletin, 40(1), 115-124
Abstract: Thin ferroelectric films of PLTx (Pb1−xLaxTi1−x/4O3) have been prepared by a sol–gel spin coating process. As deposited films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various concentrations of La (x = 0.04, 0.08 and 0.12) on ITO coated corning glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out on films annealed at temperatures (350, 450, 550 and 650 °C). Characterization of these films by X-ray diffraction shows that the films annealed at 650 °C exhibit tetragonal phase with perovskite structure. Atomic force microscope (AFM) images are characterized by slight surface roughness with a uniform crack free, densely packed structure. Fourier transform infrared spectra (FTIR) studies of PLTx thin films (x = 0.08) deposited on Si substrates have been carried out to get more information about the phase stabilization.
URI: http://eprint.iitd.ac.in/dspace/handle/2074/1517
Appears in Collections:Physics

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