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http://hdl.handle.net/2074/1517
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| DC Field | Value | Language |
|---|
| contributor.author | Chopra, Sonalee | - |
| contributor.author | Sharma, Seema | - |
| contributor.author | Goel, T C | - |
| contributor.author | Mendiratta, R G | - |
| date.accessioned | 2006-03-24T09:48:48Z | - |
| date.available | 2006-03-24T09:48:48Z | - |
| date.issued | 2005 | - |
| identifier.citation | Materials Research Bulletin, 40(1), 115-124 | en |
| identifier.uri | http://eprint.iitd.ac.in/dspace/handle/2074/1517 | - |
| description.abstract | Thin ferroelectric films of PLTx (Pb1−xLaxTi1−x/4O3) have been prepared by a sol–gel spin coating process. As deposited films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various concentrations of La (x = 0.04, 0.08 and 0.12) on ITO coated corning glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out on films annealed at temperatures (350, 450, 550 and 650 °C). Characterization of these films by X-ray diffraction shows that the films annealed at 650 °C exhibit tetragonal phase with perovskite structure. Atomic force microscope (AFM) images are characterized by slight surface roughness with a uniform crack free, densely packed structure. Fourier transform infrared spectra (FTIR) studies of PLTx thin films (x = 0.08) deposited on Si substrates have been carried out to get more information about the phase stabilization. | en |
| format.extent | 559358 bytes | - |
| format.mimetype | application/pdf | - |
| language.iso | en | en |
| subject | Thin films | en |
| subject | Atomic force microscopy | en |
| subject | X-ray diffraction | en |
| title | Phase stabilization and microstructural studies of lead lanthanum titanate thin films | en |
| type | Article | en |
| Appears in Collections: | Physics
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| choprapha2005.pdf | | 546Kb | Adobe PDF | View/Open |
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