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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1517

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dc.contributor.authorChopra, Sonalee-
dc.contributor.authorSharma, Seema-
dc.contributor.authorGoel, T C-
dc.contributor.authorMendiratta, R G-
dc.date.accessioned2006-03-24T09:48:48Z-
dc.date.available2006-03-24T09:48:48Z-
dc.date.issued2005-
dc.identifier.citationMaterials Research Bulletin, 40(1), 115-124en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/1517-
dc.description.abstractThin ferroelectric films of PLTx (Pb1−xLaxTi1−x/4O3) have been prepared by a sol–gel spin coating process. As deposited films were thermally treated for crystallization and formation of perovskite structure. Characterization of these films by X-ray diffraction (XRD) have been carried out for various concentrations of La (x = 0.04, 0.08 and 0.12) on ITO coated corning glass substrates. For a better understanding of the crystallization mechanism, the investigations were carried out on films annealed at temperatures (350, 450, 550 and 650 °C). Characterization of these films by X-ray diffraction shows that the films annealed at 650 °C exhibit tetragonal phase with perovskite structure. Atomic force microscope (AFM) images are characterized by slight surface roughness with a uniform crack free, densely packed structure. Fourier transform infrared spectra (FTIR) studies of PLTx thin films (x = 0.08) deposited on Si substrates have been carried out to get more information about the phase stabilization.en
dc.format.extent559358 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjectThin filmsen
dc.subjectAtomic force microscopyen
dc.subjectX-ray diffractionen
dc.titlePhase stabilization and microstructural studies of lead lanthanum titanate thin filmsen
dc.typeArticleen
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