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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1645

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dc.contributor.authorRavikumar, C P-
dc.contributor.authorJoshi, H-
dc.date.accessioned2006-05-10T05:46:14Z-
dc.date.available2006-05-10T05:46:14Z-
dc.date.issued1995-
dc.identifier.citationVLSI Design, Proceedings of the 8th International Conference on, 272 - 277en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/1645-
dc.description.abstractWe describe a time and space efficient technique for evaluating the SCOAP testability measure of a circuit from its hierarchical description. Under the stuck at fault model, the SCOAP measure introduced by Goldstein is known to offer a good estimate of the controllability and observability of a given circuit. SCOAP works on a gate-level netlist, and can be expensive in terms of memory and computational resources when large circuits of VLSI complexity are involved. We show that this problem can be alleviated by taking advantage of a hierarchical representation of the circuit. We introduce the notion of SCOAP expression diagrams for functional modules, which can be precomputed and stored as part of the module database. The hierarchical testability analysis program, HISCOAP reads the SCOAP expression diagrams for the modules used in the circuit, and evaluates the SCOAP measures in a systematic manner. The program has been implemented on a Sun/SPARC workstation, and we present results on several benchmark circuits, both combinational and sequentialen
dc.format.extent66535 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjecthierarchical testability analysisen
dc.subjectgate-level netlisten
dc.subjectseveral benchmark circuitsen
dc.titleHISCOAP: a hierarchical testability analysis toolen
dc.typeArticleen
Appears in Collections:Electrical Engineering

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