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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1778

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dc.contributor.authorGadre, V M-
dc.contributor.authorPatney, R K-
dc.date.accessioned2006-06-27T09:07:36Z-
dc.date.available2006-06-27T09:07:36Z-
dc.date.issued1992-
dc.identifier.citationCircuits and Systems, 3, 1513 - 1516p.en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/1778-
dc.description.abstractGranulometries with respect to a structuring element which has more than one free parameter are introduced. Various one-dimensional granulometries and related pattern spectra which can derived from these multidimensional granulometries are indicated. The need for considering such granulometries is explained. The multiparametric pecstrum is introduced, based on which a multiparametric skeletal transform is defined. It is shown how this skeletal transform can enhance the data compaction capability of the one-parametric skeletal transformen
dc.format.extent56482 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjectone-dimensional granulometriesen
dc.subjectmultiparametric skeletal transformen
dc.subjectskeletal transformen
dc.titleMultiparametric multiscale filtering, multiparametric granulometries and the associated pattern spectraen
dc.typeArticleen
Appears in Collections:Electrical Engineering

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