EPrints@IIT Delhi >
Faculty Research Publicatons  >
Applied Mechanics >

Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/181

Full metadata record

DC FieldValueLanguage
dc.contributor.authorAnitha, V P-
dc.contributor.authorMajor, S-
dc.contributor.authorChandrashekharam, D-
dc.contributor.authorBhatnagar, Mukesh-
dc.identifier.citationSurface and Coatings Technology 79, 50-54en
dc.description.abstractMolybdenum nitride thin films were prepared by the reactive r.f. magnetron sputtering echnique, on grounded substrates, using nitrogen as reactive gas. The effect of the variation of nitrogen partial pressure and the substrate temperature on the microstructure of these films has been investigated. X-ray and electron diffraction studies were used to optimize the growth conditions leading to single-phase 7-MozN thin films. The composition of the films was estimated using Auger electron spectroscopy studies. Single- phase f.c.c. 7-Mo2N films exhibiting metallic conductivity have been obtained over a wide range of nitrogen partial pressure. The films were polycrystalline in nature having grain size in the range 10-25 nm. The preferred orientation of the rystallites and the lattice parameter are found to depend on the nitrogen incorporation in the film. The morphology of all the films lies in the zone T regime of Thornton's structure zone model. The resistivity of these films exhibits a dependence on the size and orientation of the grains and appears to be determined by grain-boundary-related effects. The microstructure of the films is not significantly influenced by a variation of the substrate temperature in the range 300-575 K.en
dc.format.extent220,535 bytes-
dc.publisherElsevier Scienceen
dc.subjectMolybdenum nitrideen
dc.subjectThin filmsen
dc.subjectMagnetron sputteringen
dc.titleDeposition of molybdenum nitride thin films by r.f. reactive magnetron sputteringen
Appears in Collections:Applied Mechanics

Files in This Item:

File Description SizeFormat
anithadep96.pdf215.37 kBAdobe PDFView/Open
View Statistics

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.


Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback