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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1823

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dc.contributor.authorMavi, H S-
dc.contributor.authorPrusty, Sudakshina-
dc.contributor.authorShukla, A K-
dc.contributor.authorAbbi, S C-
dc.date.accessioned2006-06-29T03:22:06Z-
dc.date.available2006-06-29T03:22:06Z-
dc.date.issued2003-
dc.identifier.citationOptics Communications, 226(1-6), 405-413p.en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/1823-
dc.description.abstractSelf-phase modulation of continuous wave argon-ion laser beam by a medium containing silicon nanocrystallites is reported here. Refractive index of nanocrystallites shows nonlinear behavior with the intensity of probing laser beam when size of nanocrystallites is decreased below 8 nm. A simple quantitative explanation for the observed optical fringes is given in terms of distribution of sizes of nanocrystallites and intensity of laser beam. Nonlinear optical response of silicon nanocrystallites is found to have a strong correlation with the size of nanocrystallites, which are determined by the Raman scattering and photoluminescence using two-dimensional quantum confinement effects of phonons and electrons, respectively.en
dc.format.extent238779 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjectNonlinear refractive indexen
dc.subjectRaman scatteringen
dc.subjectNanocrystallitesen
dc.titleNonlinear phenomenon in nanocrystallites produced by laser-induced etching of siliconen
dc.typeArticleen
Appears in Collections:Physics

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