DSpace
 

EPrints@IIT Delhi >
Faculty Research Publicatons  >
Electrical Engineering >

Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1858

Full metadata record

DC FieldValueLanguage
dc.contributor.authorPrasad, V C-
dc.contributor.authorPinjala, S N R-
dc.date.accessioned2006-06-29T04:37:59Z-
dc.date.available2006-06-29T04:37:59Z-
dc.date.issued1993-
dc.identifier.citationElectronics Letters, 29(9), 747 - 749p.en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/1858-
dc.description.abstractA novel method using Boolean algebra is presented to obtain a minimal as well as the smallest set of test nodes in the dictionary approach to analogue fault diagnosis. This reduces the number of accessible terminals and hence the number of measurementsen
dc.format.extent50836 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjectboolean algebraen
dc.subjectanalogue fault diagnosisen
dc.titleBoolean method for selection of minimal set of test nodes for analogue fault dictionaryen
dc.typeArticleen
Appears in Collections:Electrical Engineering

Files in This Item:

File Description SizeFormat
prasadboo1993.pdf49.64 kBAdobe PDFView/Open
View Statistics

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback