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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1874

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dc.contributor.authorRavikumar, C P-
dc.contributor.authorAgrawal, N-
dc.contributor.authorAgarwal, P-
dc.date.accessioned2006-06-29T05:08:52Z-
dc.date.available2006-06-29T05:08:52Z-
dc.date.issued1996-
dc.identifier.citationVLSI, Proceedings, Sixth Great Lakes Symposium on, 220 - 225p.en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/1874-
dc.description.abstractIn this paper, we report a tool called MODET for automatic test generation for path delay faults in modular combinational circuits. Our technique uses precomputed robust delay tests for individual modules to compute robust delay tests for the module-level circuit. We propose a novel technique for path selection in module-level circuits and report efficient algorithms for delay test generation. MODET has been implemented and tested against a number of hierarchical circuits with impressive speedups in relation to gate level test generationen
dc.format.extent76752 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjectmodule-level circuiten
dc.subjecthierarchical circuitsen
dc.titleEfficient delay test generation for modular circuitsen
dc.typeArticleen
Appears in Collections:Electrical Engineering

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