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Please use this identifier to cite or link to this item:
http://hdl.handle.net/2074/1890
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Full metadata record
| DC Field | Value | Language |
|---|
| contributor.author | Thomas, R | - |
| contributor.author | Dube, D C | - |
| date.accessioned | 2006-06-29T10:30:20Z | - |
| date.available | 2006-06-29T10:30:20Z | - |
| date.issued | 1997 | - |
| identifier.citation | Electronics Letters, 33(3), 218 - 220p. | en |
| identifier.uri | http://eprint.iitd.ac.in/dspace/handle/2074/1890 | - |
| description.abstract | An extended cavity resonance method using the TE10η mode is discussed for measuring complex permittivity of dielectric films and foils of flexible dimensions nondestructively. Working relations for dielectric parameters ϵ' and ϵ" are obtained on extending the validity of conventional cavity perturbation technique. Results of measurements performed on mylar are presented. The method is suitable for the determination of complex permittivity of dielectric thin films | en |
| format.extent | 62405 bytes | - |
| format.mimetype | application/pdf | - |
| language.iso | en | en |
| subject | dielectric parameters | en |
| subject | cavity perturbation technique | en |
| title | Extended technique for complex permittivity measurement of dielectric films in the microwave region | en |
| type | Article | en |
| Appears in Collections: | Physics
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| File |
Description |
Size | Format |
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| thomasext1997.pdf | | 60Kb | Adobe PDF | View/Open |
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