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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1890

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dc.contributor.authorThomas, R-
dc.contributor.authorDube, D C-
dc.date.accessioned2006-06-29T10:30:20Z-
dc.date.available2006-06-29T10:30:20Z-
dc.date.issued1997-
dc.identifier.citationElectronics Letters, 33(3), 218 - 220p.en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/1890-
dc.description.abstractAn extended cavity resonance method using the TE10η mode is discussed for measuring complex permittivity of dielectric films and foils of flexible dimensions nondestructively. Working relations for dielectric parameters ϵ' and ϵ" are obtained on extending the validity of conventional cavity perturbation technique. Results of measurements performed on mylar are presented. The method is suitable for the determination of complex permittivity of dielectric thin filmsen
dc.format.extent62405 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjectdielectric parametersen
dc.subjectcavity perturbation techniqueen
dc.titleExtended technique for complex permittivity measurement of dielectric films in the microwave regionen
dc.typeArticleen
Appears in Collections:Physics

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