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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/1970

Title: A new test compression scheme
Authors: Bhaumik, B
Visweswaran, G S
Lakshminarasimhan, R
Keywords: generalized modified positional syndrome
Issue Date: 1999
Citation: VLSI Design, Proceedings Twelfth International Conference On, 95 - 98p.
Abstract: Generalized Modified Positional Syndrome (GMPS), of order p, a new compaction scheme for test output data is presented. The order p determines the aliasing probability and the amount of hardware overhead required to implement the scheme. GMPS of order two gives an aliasing probability about an order of magnitude lower than the best scheme reported in literature with minimal extra hardware. A hardware realization scheme for GMPS has been presented. The scheme uses adders with feedback
URI: http://eprint.iitd.ac.in/dspace/handle/2074/1970
Appears in Collections:Electrical Engineering

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