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http://hdl.handle.net/2074/2334
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| Title: | Surface characterization of nitrogen-ion-implanted etched and polished AISI 316 stainless steel |
| Authors: | Aggarwal, Sanjeev
Goel, A K
Mohindra, R K
Ghosh, P K
Bhatnagar, M C |
| Keywords: | nitrogen ion
AISI 316 stainless steel
auger electron
X-ray photoelectron
glancing-angle X-ray
γ-austenite |
| Issue Date: | 1994 |
| Citation: | Thin Solid Films, 237(1-2), 175-180p. |
| Abstract: | The influence of nitrogen ion implantation on the surface characteristics of AISI 316 stainless steel has been examined on two different surfaces of the substrate: strain-induced (mechanically polished) and excess-strain-free (chemically etched) surfaces. Samples were implanted with 2.5 × 1021 N2+ m−2 at 130 keV. The characteristics of the implanted layer and depth profile were investigated by Auger electron spectroscopy and X-ray photoelectron spectroscopy. The identification of the phase change and compounds formed was studied by glancing-angle X-ray diffraction. No phase transformation from the γ-austenite phase was observed as a result of mechanical polishing and after implantation. The formation of Cr2N is observed in both surfaces with some ε-Fe2N---Fe3N on the polished surface only. The surface hardness is found to be enhanced after implantation in both these cases and its dependence is discussed with respect to the changes observed after implantation. |
| URI: | http://eprint.iitd.ac.in/dspace/handle/2074/2334 |
| Appears in Collections: | Physics
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