EPrints@IIT Delhi >
Faculty Research Publicatons  >
Physics >

Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/361

Full metadata record

DC FieldValueLanguage
dc.contributor.authorChaudhary, Sujeet-
dc.contributor.authorKashyap, Subhash C-
dc.contributor.authorPandya, D K-
dc.contributor.authorKulkarni, V N-
dc.identifier.citationPhysica C, 280, 37-42en
dc.description.abstractThe epitaxial films of YBCO grown by low pressure (~ 10 -3 Ton') rf-magnetron sputtering, exhibiting 'c'-axis lattice parameter 11.753 A and 11.718 A on MgO(100) and SrTiO3(100), respectively, were subjected to the Rutherford backscattering technique (RBS) for their compositional analysis. The backscattering-simulations performed on these films have revealed a gradient in the concentration of both Ba and Cu cations across the thickness of the film. The cation ratios (Ba:Y and Cu:Y) in the films grown on different substrates are found to be substrate dependent. In this paper, an attempt has been made to correlate the observed cation deficiencies with the employed experimental conditions. It is conjectured that the observed cation deficiency is expected to give rise to 'Y-for-Ba' replacement, thereby resulting in the extension of the c-axis parameter. This atomic disorder (replacement) also explains the observed lower values of T c.en
dc.format.extent197116 bytes-
dc.subjectRf-magnetron sputteringen
dc.subjectThin filmsen
dc.subjectHigh temperature superconductivityen
dc.subjectAtomic disorderen
dc.titleAtomic disorder in low pressure rf-sputtered YBCO superconducting thin filmsen
Appears in Collections:Physics

Files in This Item:

File Description SizeFormat
chaudharyato97.pdf192.5 kBAdobe PDFView/Open
View Statistics

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.


Valid XHTML 1.0! DSpace Software Copyright © 2002-2010  Duraspace - Feedback