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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/476

Title: GaGeTe films as phase-change optical recording media
Authors: Sripathi, Y
Malhotra, L K
Reddy, G B
Keywords: Evaporation
Optical properties
Structural properties
Crystallization
Issue Date: 1995
Citation: Thin Solid Films, 270(1-2), 60-64
Abstract: GazoGe30Te50 thin films deposited by vacuum evaporation on various substrates have been studied for their structural and optical properties. The as-deposited amorphous films were crystallized by thermally annealing them. The optical constants of the amorphous films indicate semiconducting behaviour (n > k). The optical bandgap (Eg) determined from Tauc’s plot is 0.7 eV. The change in reflectance on crystallization has been utilized to obtain maximum optical contrast by optimising the thickness of the film.
URI: http://eprint.iitd.ac.in/dspace/handle/2074/476
Appears in Collections:Physics

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