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|Title: ||A functional-level testability measure for register-level circuits and its estimation|
|Authors: ||Ravikumar, C P|
Saund, G S
|Keywords: ||Level circuits|
|Issue Date: ||1999|
|Citation: ||Microprocessors and Microsystems, 22(9), 535–542|
|Abstract: ||Estimation of circuit testability is an important issue when evaluating the circuit design. A testability measure indicates how easy or difficult it would be to generate tests for the circuit. STAFAN (Statistical Fault Analysis) is a well known gate-level testability analysis program which predicts the fault coverage of a digital circuit under the stuck-at fault model, without actually performing fault simulation.
STAFAN offers speed advantage over other testability analysis programs such as SCOAP; further, it explicitly predicts the fault coverage for a given test set, unlike other testability measures which are harder to interpret. We show how a STAFAN-like testability analysis program can be constructed for circuits built out of register-level modules such as adders, multipliers, multiplexers, and busses. Our tool, which we call FSTAFAN, is useful in a testability-driven high-level synthesis environment. We have implemented FSTAFAN on a Sun/SPARC workstation and describe its performance on some register-level circuits.|
|Appears in Collections:||Electrical Engineering|
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