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|dc.contributor.author||Ravikumar, C P||-|
|dc.contributor.author||Saund, G S||-|
|dc.identifier.citation||Microprocessors and Microsystems, 22(9), 535–542||en|
|dc.description.abstract||Estimation of circuit testability is an important issue when evaluating the circuit design. A testability measure indicates how easy or difficult it would be to generate tests for the circuit. STAFAN (Statistical Fault Analysis) is a well known gate-level testability analysis program which predicts the fault coverage of a digital circuit under the stuck-at fault model, without actually performing fault simulation.
STAFAN offers speed advantage over other testability analysis programs such as SCOAP; further, it explicitly predicts the fault coverage for a given test set, unlike other testability measures which are harder to interpret. We show how a STAFAN-like testability analysis program can be constructed for circuits built out of register-level modules such as adders, multipliers, multiplexers, and busses. Our tool, which we call FSTAFAN, is useful in a testability-driven high-level synthesis environment. We have implemented FSTAFAN on a Sun/SPARC workstation and describe its performance on some register-level circuits.||en|
|dc.title||A functional-level testability measure for register-level circuits and its estimation||en|
|Appears in Collections:||Electrical Engineering|
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