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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/948

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dc.contributor.authorBalamurugan, B-
dc.contributor.authorMehta, B R-
dc.date.accessioned2005-10-18T05:50:04Z-
dc.date.available2005-10-18T05:50:04Z-
dc.date.issued2001-
dc.identifier.citationThin Solid Films, 396(1-2), 90–96en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/948-
dc.description.abstractNanocrystalline Cu O thin films have been synthesized using an activated reactive evaporation technique.Structural and optical 2 characterizations of these films have been carried out using: glancing angle X-ray diffractometer; Fourier transform infrared spectrometer; transmission electron microscope; and UV-VIS-NIR spectrophotometer.The nanocrystallite size in these films was varied by varying deposition parameters.Optical studies show a direct allowed transition and a shift in the optical absorption edge from the bulk value with nanocrystallite size and stoichiometry of these films.These results show that single phase nanocrystalline Cu O thin films can be synthesized at a relatively low substrate temperature using the activated reactive evaporation 2 technique.These studies indicate that nanocrystallinity results in the stability of cubic Cu O phase in these films.en
dc.format.extent491082 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjectCuprous oxideen
dc.subjectNanocrystalline thin filmsen
dc.subjectOptical propertiesen
dc.subjectStructural propertiesen
dc.subjectX-Ray diffractionen
dc.titleOptical and structural properties of nanocrystalline copper oxide thin films prepared by activated reactive evaporationen
dc.typeArticleen
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