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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/989

Title: Surface EXAFS study of the p4g(2×2) reconstruction of C on Ni(100) and C on Ni films
Authors: Wende, H
Chauvistre, R
Haack, N
Ceballos, G
Wilhelm, F
Baberschke, K
Srivastava, P
Arvanitis, D
Keywords: Carbon
Extended X-ray absorption fine structure (EXAFS)
Nickel
Surface relaxation and reconstruction
Issue Date: 2000
Citation: Surface Science, 465(3), 187–197
Abstract: We report temperature- and angular- ependent surface extended X-ray absorption fine structure spectroscopy (SEXAFS) measurements of the p4g(2×2)C/Ni(100) system. Both a Ni(100) single crystal and a 4 monolayer Ni film evaporated on a Cu(100) single crystal were used as substrates. The k-space used for the data analysis needs to be truncated at low k values. This is due to a strong increase of the atomic background close to the edge, which prevents a clear separation of near-edge features from the SEXAFS oscillations. For both substrates the local structure can be described by the ’clockwise’ reconstruction of the surface. This leads to a strong anisotropy of the vibrational amplitudes: the vibrational amplitude for the out-of-plane CMNi bond at room temperature is determined to be twice as large as that for the in-plane motion.
URI: http://eprint.iitd.ac.in/dspace/handle/2074/989
Appears in Collections:Physics

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