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Please use this identifier to cite or link to this item: http://eprint.iitd.ac.in/handle/2074/989

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dc.contributor.authorWende, H-
dc.contributor.authorChauvistre, R-
dc.contributor.authorHaack, N-
dc.contributor.authorCeballos, G-
dc.contributor.authorWilhelm, F-
dc.contributor.authorBaberschke, K-
dc.contributor.authorSrivastava, P-
dc.contributor.authorArvanitis, D-
dc.date.accessioned2005-12-20T06:14:30Z-
dc.date.available2005-12-20T06:14:30Z-
dc.date.issued2000-
dc.identifier.citationSurface Science, 465(3), 187–197en
dc.identifier.urihttp://eprint.iitd.ac.in/dspace/handle/2074/989-
dc.description.abstractWe report temperature- and angular- ependent surface extended X-ray absorption fine structure spectroscopy (SEXAFS) measurements of the p4g(2×2)C/Ni(100) system. Both a Ni(100) single crystal and a 4 monolayer Ni film evaporated on a Cu(100) single crystal were used as substrates. The k-space used for the data analysis needs to be truncated at low k values. This is due to a strong increase of the atomic background close to the edge, which prevents a clear separation of near-edge features from the SEXAFS oscillations. For both substrates the local structure can be described by the ’clockwise’ reconstruction of the surface. This leads to a strong anisotropy of the vibrational amplitudes: the vibrational amplitude for the out-of-plane CMNi bond at room temperature is determined to be twice as large as that for the in-plane motion.en
dc.format.extent1395052 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoenen
dc.subjectCarbonen
dc.subjectExtended X-ray absorption fine structure (EXAFS)en
dc.subjectNickelen
dc.subjectSurface relaxation and reconstructionen
dc.titleSurface EXAFS study of the p4g(2×2) reconstruction of C on Ni(100) and C on Ni filmsen
dc.typeArticleen
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