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  • The effects of transistor source-to-gate bridging faults in complex CMOS gates 

    Visweswaran, G S; Ali, Akhtar-uz-zaman M; Lala, Parag K; Hartmann, Carloss R P (1991)
    A study of the effect of gate-to-source bridging faults in the pull-up section of a complex CMOS gate is presented. The manifestation of these faults depends on the resistance value of the connection causing the bridging. ...