IIT DELHI
  Home > Archives > Earthquake Engineering > View Record

Record Details

Research
Support Tool
  For this 
monograph
Capture Cite
View Metadata
Printer Friendly
Context
Author Bio
Define Terms
Related Studies
Media Reports
Google Search
Action
Email Others
Add to Portfolio
On the solution of first-excursion failure problem for linear systems by efficient simulation

Title: On the solution of first-excursion failure problem for linear systems by efficient simulation
Author(s): Au, Siu-Kui
Beck, James L.
Date: 2000-01-01
Abstract: An analytical study of the failure region of the first-excursion reliability problem for linear dynamical systems subjected to Gaussian white noise excitation is carried out with a view to constructing a suitable importance sampling density for computing the first-excursion failure probability. Central to the study are 'elementary failure regions', which are defined as the failure region in the load space corresponding to the failure of a particular output response at a particular instant. Each elementary failure region is completely characterized by its design point, which can be computed readily using impulse response functions of the system. It is noted that the complexity of the first-excursion problem stems from the structure of the union of the elementary failure regions. One important consequence of this union structure is that, in addition to the global design point, a large number of neighboring design points are important in accounting for the failure probability. Using information from the analytical study, an importance sampling density is proposed. Numerical examples are presented, which demonstrate that the efficiency of using the proposed importance sampling density to calculate system reliability is remarkable.
Index terms:
Discipline(s): Earthquake Engineering Research Laboratory
Subject(s):
Method/Approach: NonPeerReviewed
Coverage:
Publisher: California Institute of Technology
Contributors:
Source:
Language:
Relation: http://caltecheerl.library.caltech.edu/28/00/EERL-2000-01.pdf
Type: Monograph
Format: application/pdf
Copyright Information:
 

Browse Archive

Home | Search | Archives | Submit Archive | Links | About

© 2003-2004 Central Library, IIT Delhi-110 016, INDIA, Powered by Public Knowledge Project